Agilent Technologies EasyEXPERT User's Guide Page 79

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Agilent EasyEXPERT Users Guide Vol. 2, Edition 1 8-3
Application Library
Application Test Definitions
Application Test Definitions
Agilent EasyEXPERT software contains the application library which supports the
several characteristic measurements listed in Table 8-1. They are classified into the
following categories.
•BJT
•CMOS
Discrete
GenericTest
•MCSMU_IV
•Memory
MixedSignal
NanoTech
•Organic
PwrDevice
Reliability
•Sample
•Solar Cell
SPGU_PLSDIV
Structure
•TFT
Utility
•WGFMU
WGFMU Utility
•WGFMU_IV
•GaN Diode
•GaN FET
•IGBT
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