Agilent Technologies 8114A User Manual

Browse online or download User Manual for Measuring, testing & control Agilent Technologies 8114A. Agilent 4073A - Agilent Technologies

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General Description
The Agilent 4073A Ultra Ad-
vanced Parametric Tester is
designed to perform fast and
precise DC measurements,
capacitance measurements, Flash
memory cell tests, and other
high-frequency applications. The
system supports up to eight
Source Monitor Units (SMUs).
Each SMU is self-calibrating,
and can be individually config-
ured to force either current or
voltage, as well as simulta-
neously measure either current
or voltage.
External instruments can be
integrated into the system via six
auxiliary input ports or 48
extended path inputs. The
extended path inputs allow the
Agilent 4073A
Ultra Advanced Parametric Tester
user to connect external signals
directly to the DUT pins. A low-
leakage switching matrix con-
nects all of the inputs to fully-
guarded Kelvin output pins,
which are customizable from 12
to 48 pins. One special additional
pin is dedicated as a chuck
connection. The 4073A also has a
high-frequency switching matrix
with integrated pulse generator
control. The high-frequency
matrix is organized as two 3
×
24
matrices (six inputs in total), and
1 TO 2 furnished connectors may
be used on each matrix pair to
create one 3
×
48 matrix (three
inputs in total). The system also
has one 1.6 A ground unit.
Data Sheet
Contents
General Description 1-2
Switching Matrix Subsystem 3
Pulse Switch 4
DC Measurement Subsystem: SMU 4-6
Capacitance Measurement Subsystem:
Agilent E4980A LCR Meter 8
Pulse Force Unit: PGU Option 8-9
Pulse Force Unit: HV0SPGU Option 10
System Controller 10
System Software Capabilities 10
Agilent Semiconductor Process
Evaluation Core Software (SPECS) 10
General Specifications 11
Recommended Conditions for Low
Current and Low Voltage Measurements 11
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Summary of Contents

Page 1 - Agilent 4073A

General DescriptionThe Agilent 4073A Ultra Ad-vanced Parametric Tester isdesigned to perform fast andprecise DC measurements,capacitance measurements

Page 2

10Agilent SemiconductorProcess Evaluation CoreSoftware (SPECS)Agilent SPECS is a test shellenvironment for the Agilent 4070Series.InputUser interactio

Page 3 - Switching Matrix Subsystem

11Recommended Conditionsfor Low Current and LowVoltage MeasurementsIn addition to the conditionslisted in General Specifications,Agilent Technologies

Page 4 - Pulse Switch

For more information about Agilent Technologiesand its products, go to www.agilent.com.For more information about Agilent parametrictest products, app

Page 5

General Description(continued)High-Frequency Pulse Force:PGU OptionSupported pulse generators:Agilent 81110A and 8114AMaximum number of installablepul

Page 6 - Voltage(V)

Maximum DUT Pins48 output pins plus one pin forthe prober chuck connection(triaxial connector). Only theE3122A (high-resolution pinboard) can be used

Page 7

Pulse SwitchThe pulse switch includes sevensemiconductor switching relays,for reliable and direct control ofpulse shaping by the pulsegenerator or CPU

Page 8 - Pulse Force Unit: PGU Option

Voltage Source/Monitor Range, Resolution, and Accuracy using MPSMU and HPSMUForce Accuracy is calculated as follows:±(a % of output setting value + b%

Page 9

Maximum Output Voltage/CurrentOver Current Range:15% of range (0% for 100 mArange of MPSMU/HRSMU, 0%for 1 A range of HPSMU, 5% for10 pA/100 pA range o

Page 10 - Pulse Setting Range

SMU configurationMinimum configuration:One HRSMU and two MPSMUs(default configuration)A maximum of two HRSMUs canbe installed and connected onlyto the

Page 11 - General Specifications

8Supported Pulse Generators: 81110A and 8114AMaximum Number of Installable PulseGenerators:81110A × 5 (without 8114A)81110A × 4 (with 8114A × 1)81110A

Page 12

9accurate pulse width andpulse delay than normalmode).Note: Agilent 8114A does not support pattern mode.Load impedance999 kΩ (default), selectable fro

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