Agilent Technologies E6392B Specifications Page 124
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Chapter 4 127
Programming Command Cross Reference
CONFIGURATION Screen
4. Programming Command
Cross Reference
CONFIGURATION Screen
The CONFigure subsystem commands are used to set the controls and parameters
associated with the basic system requirement, SRAM file management, test
condition, and test sequence.
File Management Screens
The following FILE commands are used to manage the test setup files and an
SRAM memory card.
Table 4-3 FILE Command Cross Reference
Item Command
Delete File CONFigure:FILE:DELete <filename>
Format Card CONFigure:FILE:FORMat
List Files CONFigure:FILE:LIST?
Recall File CONFigure:FILE:RECall <filename>
Save File CONFigure:FILE:SAVE <filename>,<comment>
- Agilent Technologies 2
- E6392B GSM MS Test Set 2
- Programmer’s Guide 2
- Agilent Technologies Limited 3
- Printing 4
- Contents 10
- 1 Preparing for Use 14
- 14 Chapter 1 15
- Preparing for Use 15
- Connecting to Controller 16
- 16 Chapter 1 17
- 2. Programming Command 18
- Guidelines 18
- Understanding Common Terms 19
- Standard Notation 20
- Command Syntax 21
- Units of Measure 22
- Character Format Parameters 24
- Modem Line Handshaking 24
- Data Transfer Errors 24
- Programming Guidelines 25
- Using the Status Registers 26
- 26 Chapter 2 27
- Status Register System 28
- Status Byte Register 29
- 30 Chapter 2 31
- Error Messages 32
- 32 Chapter 2 33
- 3. Programming Command 34
- Reference 34
- Standard Event Status Enable 36
- Status Byte Register Query 36
- CONFigure Subsystem 37
- Beeper Control 38
- Network Configuration 38
- Panel Key Control 38
- Printer Control 39
- Delete File 39
- Format Card 39
- List Files 39
- Recall File 40
- Save File 40
- BER Frames 41
- BER Limit 41
- BLER Limit 42
- Burst Timing Limit 42
- DC Current Limit 42
- FER Limit 43
- Frequency Error Limit 43
- Loopback Delay 43
- MS Power Class 43
- Peak TX Power Limit 44
- Phase Error Limit 44
- RF Output 45
- RX Level Limit 45
- RX Quality Limit 46
- 1st Call Test 47
- 2nd Call Test 47
- 6 Measurement DC Power Loop 47
- Burst Timing Test 49
- DC Current Test 50
- Frequency Error Test 50
- Instruction Message # 51
- LOC. Update 52
- Peak TX Power Test 52
- Phase Error Test 53
- Power Ramp Test 53
- RX Level Test 54
- RX Quality Test 54
- Sensitivity Test 54
- Talk Test 55
- Talk Test TCH Channel 55
- Talk Test TCH Frequency 55
- DISPlay Subsystem 57
- Stand-by (GPRS Mode) 60
- Stand-by (Synchronous Mode) 60
- RF Signal Generator 60
- Spectrum Monitor 60
- HCOPy Subsystem 61
- RFGenerator Subsystem 62
- RF Signal Output Mode 63
- SMONitor Subsystem 65
- Measurement Range 66
- SYSTem Subsystem 69
- Chapter 3 69 70
- Programming Command Reference 70
- All Tests Results (Detail) 71
- All Tests Results (Summary) 72
- Burst Timing Measurement 73
- Power Ramp Graph Zoom 73
- Power Ramp Marker Measurement 74
- DC Current Measurement 75
- MS Information 76
- Peak TX Power Measurement 76
- Sensitivity Measurement 80
- 6 Measurement DCP Variable 81
- 6 Measurement TCH Variable 81
- Screen Mode 83
- Signaling State 83
- Talk Test Result 84
- Talk Test TCH 84
- BS Release 89
- GPRS Test End 89
- MS Release 90
- Signaling State (GPRS mode) 91
- Signaling State (SYNC mode) 91
- Measurement Screen 94
- Actual Timing Advance 95
- DC Power Voltage 100
- Frequency Error Measurement 100
- Midamble 100
- Phase Error Measurement 101
- Power Control Level 101
- Traffic Channel 102
- Traffic Channel Frequency 102
- RX Quality Measurement 104
- RX Level Measurement 104
- BER BS Level 105
- Sensitivity Test Frames 106
- Averaging Function 107
- BS Level 107
- Marker Measurement 108
- Marker Position Control 108
- Measurement Result 108
- Resolution Bandwidth 109
- BCCH Channel 111
- BCCH Frequency 112
- DC Power Mode 112
- Measurement Mode 112
- MS Signal 113
- Multi Band 114
- Radio Standard 114
- Slot Configuration 114
- Slot Measured 115
- Timing Advance 115
- TRIGger Subsystem 117
- 4. Programming Command 118
- Cross Reference 118
- AUTOMATIC TEST Screens 119
- Test Result Screens 121
- 126 Chapter 4 123
- Item Command 123
- CONFIGURATION Screen 124
- System Configuration Screen 125
- 130 Chapter 4 127
- 132 Chapter 4 129
- Display Each Screen 131
- IEEE Common Commands 133
- MANUAL TEST Screens 134
- 138 Chapter 4 135
- Measuring Screens 136
- DC Current Measuring Screens 137
- MS Information Screen 138
- 142 Chapter 4 139
- 144 Chapter 4 141
- Spectrum Monitor Screens 142
- Print Screen Function 143
- SIGNAL GENERATOR Screen 144
- SPECTRUM MONITOR Screens 145
- System Control Function 146
- Trigger Function 147
- 5 Example Programs 148
- 148 Chapter 5 149
- Example Programs 149
- Chapter 5 149 150
- 5. Example Programs 150
- 150 Chapter 5 151
- 2080 UNTIL BIT(F,4)=1 152
- 2100 END 152
- Chapter 5 153 154
- 154 Chapter 5 155
- AUTOMATIC TEST Sample Program 159
- Chapter 5 159 160
- 160 Chapter 5 161
- A Syntax Diagrams 164
- 164 Appendix A 165
- Syntax Diagrams 165
- Appendix A 165 166
- A. Syntax Diagrams 166
- 166 Appendix A 167
- Appendix A 167 168
- 168 Appendix A 169
- Figure A-8 HCOPy Subsystem 170
- Figure A-11 SYSTem Subsystem 171
- Appendix A 171 172
- 172 Appendix A 173
- Appendix A 173 174
- 174 Appendix A 175
- Appendix A 175 176
- 176 Appendix A 177
- Appendix A 177 178
- 178 Appendix A 179
- B. Command Difference 180
- Changed Commands 181
- 188 Appendix B 183
- (PWR CNTL 183
- Appendix B 189 184
- 190 Appendix B 185
- Appendix B 191 186
- Appendix B 193 188
- 194 Appendix B 189
- Appendix B 195 190
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