Agilent Technologies B1500A User's Guide Page 145

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Keysight B1500A User’s Guide, Ed ition 14 4- 5
Specifications
Hardware
Spot, sweep, and more measurement capabilities
Sampling (time domain) measurement from 100 s
Pulse measurement from 500 s pulse width
Accurate Quasi-Static Capacitance Voltage (QSCV) measurement with leakage
current compensation
B1514A Medium current source/monitor unit (MCSMU).
Slots occupied: 1
Range up to 30 V/1 A pulsed (0.1 A DC) with 4-quadrant operation
Pulse measurement from 50 s pulse width with 2 s resolution
Oscilloscope view for voltage/current waveform monitoring
Minimum measurement resolution 10 pA/0.2 V
B1520A Multi-frequency capacitance measurement unit (MFCMU).
Slots occupied: 1
AC impedance measurement (C-V, C-f, C-t)
1 kHz to 5 MHz frequency range with minimum 1 mHz frequency resolution
25 V built-in DC bias and 100 V DC bias with SMU and SCUU (SMU CMU
Unify Unit)
Easy and fast yet accurate IV and CV automated connection change by SCUU
B1525A High voltage semiconductor pulse generator unit (HV-SPGU).
Slots occupied: 1
High voltage output up to ± 40 V applicable for non-volatile memory testing
Two-level and three-level pulse capability by single channel
Flexible arbitrary waveform generation with 10 ns resolution (arbitrary linear
waveform generation function)
Two channels per module
B1530A Waveform generator / fast measurement unit (WGFMU).
Slots occupied: 1
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