Agilent Technologies 16048A Specifications Page 100

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Index
Accessories vs. Instruments Matrix
Note: Refer to the accessory descriptions for frequency and operational limits.
1. Compatible when used in conjunction with 16085B.
2. 7-mm cable is required
3. Do not connect the ground lead to the instrument
4. 3.5-mm (M) to 7-mm adapter is required
Test accessories/fixtures
16034E SMD/chip test fixture DC-40 MHz
••• ••
16034G SMD/chip test fixture, small DC-110 MHz
••• ••
16034H SMD/chip test fixture, general DC-110 MHz
••• ••
16043-60011/12
3-terminal SMD test fixture DC-110 MHz
••• ••
16044A SMD/chip test fixture, Kelvin contacts, 10 MHz DC-10 MHz
••• ••
16047A Axial and radial test fixture DC-13 MHz
••• ••
16047D Axial and radial test fixture DC-40 MHz
••• ••
16047E Axial and radial test fixture, 110MHz DC-110 MHz
••• ••
16048A One meter test leads, BNC DC-30 MHz
••• ••
16048-60030 One meter test leads, SMC DC-30 MHz
••• ••
16048D Two meter test leads, BNC DC-30 MHz
••• ••
16048E Four meter test leads, BNC DC-1 MHz
••
16048G One meter test leads, BNC, 110 MHz DC-110 MHz
16048H Two meter test leads, BNC, 110 MHz DC-110 MHz
16060A Transformer test fixture DC-100 kHz
16065A Ext. voltage bias with safety cover (<=200 vdc) 50 Hz-2 MHz
••• ••
16065C External bias adapter (<=40 vdc) 50 Hz-1 MHz
16085B Four-terminal pair to 7-mm adapter DC-40 MHz
••• ••
16089A/B/C/D/E Kelvin clip leads 5 Hz-100 kHz
•• •• ••
16092A RF spring clip: axial, radial and SMD DC-500 MHz
••• ••
16094-65000 RF probe tip/adapter DC-125 MHz
••• ••
16095A LF impedance probe DC-13 MHz
••• ••
16192A Parallel electrode SMD test fixture DC-2 GHz
••• ••
16194A High temperature component test fixture DC-2 GHz
••• ••
16196A/B/C/D Parallel electrode SMD test fixture DC-3 GHz
••• ••
16197A Bottom electrode SMD test fixture DC-3 GHz
••• ••
16200B External DC bias adapter 1 MHz-1 GHz
••
16314-60011 4-terminal balun (50 Ω bal. to 50 Ω unbal.) 100 Hz-10 MHz
••• ••
16315-60011 One terminal (BNC) Balun (50 Ω bal. to 50 Ω unbal.) 100 Hz-10 MHz
••
16316A One terminal (BNC) Balun (100 Ω bal. to 50 Ω unbal.) 100 Hz-10 MHz
••
16317A One terminal (BNC) Balun (600 Ω bal. to 50 Ω unbal.) 100 Hz-3 MHz
••
16334A SMD/chip tweezer DC-15 MHz
••• ••
16451B Dielectric material test fixture 5 Hz-30 MHz
••• ••
16452A Liquid test fixture 20 Hz-30 MHz
••
16453A Dielectric material test fixture 1 MHz-1 GHz
16454A Magnetic material test fixture 1 kHz-1 GHz
••
42842A/B High bias current 20 A/40 A test fixture 20 Hz-1 MHz
••
42842C High bias current 10 A test fixture 75 kHz-30 MHz
42941A Impedance probe kit DC-110 MHz
42942A Four-terminal pair to 7-mm adapter DC-110 MHz
1111141 1 1
1,2 1,2 1,2 1,2 1,2 2,4 1,2 2 2 2 1,2 1,2 2
33333 3 3 1
1111141 1 1
1111141 1 1
1111141 1 1
1111141 1 1
4
4263B
4268A
4279A
4284A
4285A
4287A
4288A
4294A
4294A with
42942A
4395A w/Option
4395A-010 and 43961A
4396B w/Option
4396B-010 and 43961A
E4980A
E4981A
E4991A
Simplify and Improve Your Measurements with Agilent's Test Accessories
Selecting a test fixture is as important as selecting the right
instrument. Agilent offers a wide range of accessories for
axial, radial, and SMD/Chip devices. In addition, a vari-
ety of test leads are available to simplify remote testing
and systems applications. External test fixtures with
safety covers are also available.
You will improve your measurement results with the
proper test fixture.
more reliable and repeatable measurement
higher through-put
fewer handling errors
tighter test limits
better measurement accuracy
For additional product information and literature, visit our
Accessories Web site: www.agilent.com/find/accessories
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