Agilent B1500 User’s Guide, Edition 7 10-3
Application Library and Utilities
Application Test Definitions
Application Test Definitions
Agilent EasyEXPERT software contains the application library which supports the
characteristic measurements of CMOS devices, TFT, BJT, diode, resistor, capacitor,
varactor, memory, nanotechnology devices such as CNT FET, and so on. The
application library includes more than one hundred test definitions. And they are
classified into the following categories. Table 10-1 lists all test definitions belonging
to the category. Each test definition requires the modules and instruments shown in
the table.
1. BJT
2. CMOS
3. Discrete
4. Generic Test
5. Memory
6. Mixed Signal
7. Nano Tech
8. Power Device
9. Reliability
10. Structure
11. TFT
12. Utility
13. WGFMU
NOTE Application Library
The application library is a set of test definitions effective for the EasyEXPERT
application test execution mode. The application test can be performed by selecting
a test definition and setting the test condition for the actual DUT (device under test).
And the setup can be saved as the dedicated test setup for the DUT.
All test definitions are just sample. If the samples damage your devices, Agilent
Technologies is NOT LIABLE for the damage.
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