Agilent Technologies 4294A Specifications download pdf (Page 12)

Figure 1-9. Capacitor frequency response

Test signal level:

The test signal (AC) applied may affect the measurement result for some components. For example,

ceramic capacitors are test signal voltage dependent as shown in Figure 1-10 (a). This dependency

varies depending on the dielectric constant (K) of the material used to make the ceramic capacitor.

Cored-inductors are test signal current dependent due to the electromagnetic hysteresis of the core

material. Typical AC current characteristics are shown in Figure 1-10 (b).

Figure 1-10. Test signal level (AC) dependencies of ceramic capacitors and cored-inductors

DC bias:

DC bias dependency is very common in semiconductor components such as diodes and transistors.

Some passive components are also DC bias dependent. The capacitance of a high-K type dielectric

ceramic capacitor will vary depending on the DC bias voltage applied, as shown in Figure 1-11 (a).

In the case of cored-inductors, the inductance varies according to the DC bias current flowing

through the coil. This is due to the magnetic flux saturation characteristics of the core material.

Refer to Figure 11 (b).

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Agilent Technologies 4294A Specifications Page 12