Agilent Technologies 4294A Specifications Page 22

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2-4. Key measurement functions
The following discussion describes the key measurement functions for advanced impedance mea-
surement instruments. Thoroughly understanding these measurement functions will eliminate the
confusion sometimes caused by the measurement results obtained.
2-4-1. OSC level
The oscillator output signal is output through the Hc terminal and can be varied to change the test
signal level applied to the DUT. The specified output signal level, however, is not always applied
directly to the DUT. In general, the specified OSC level is obtained when the High terminal is open.
Since source resistor Rs is connected in series with the oscillator output, as shown in Figure 2-6,
there is a voltage drop across Rs. So, when the DUT is connected, the applied voltage Vx depends on
the value of the Source resistor and the DUT’s impedance value, Zx. This must taken into considera-
tion especially when measuring low values of impedance (low inductance or high capacitance). The
OSC level should be set as high as possible to obtain a good S/N ratio for the vector ratio detector
section. A high S/N ratio improves the accuracy and stability of the measurement. In some cases,
however, the OSC level should be decreased, such as when measuring cored-inductors, and when
measuring semiconductor devices in which the OSC level is critical for the measurement and to the
device itself.
Figure 2-6. OSC level divided by source resistor (Rs) and DUT impedance (Zx)
2-8
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