Agilent Technologies 4294A Specifications download pdf (Page 3)

The Impedance Measurement Handbook

A Guide to Measurement Technology and Techniques

2000-2003 Agilent Technologies Co. Ltd

TABLE OF CONTENTS

SECTION 1 Impedance measurement basics

Paragraph 1-1 Impedance ...................................................................................... 1-1

1-2 Measuring impedance .................................................................. 1-3

1-3 Parasitics: there are no pure R, C or L ...................................... 1-3

1-4 True, effective and indicated values .......................................... 1-4

1-5 Component dependency factors ................................................. 1-5

SECTION 2 Impedance measurement instruments

Paragraph 2-1 Measurement methods ................................................................. 2-1

2-2 Operating theory of practical instruments ............................... 2-5

––––––– LF impedance measurement –––––––

2-3 Theory of auto balancing bridge method ................................... 2-5

2-4 Key measurement functions ........................................................ 2-8

2-4-1 OSC level ........................................................................................ 2-8

2-4-2 DC bias ............................................................................................ 2-9

2-4-3 Ranging function ........................................................................... 2-10

2-4-4 Level monitor function ................................................................. 2-11

2-4-5 Measurement time and averaging .............................................. 2-11

2-4-6 Compensation function ................................................................ 2-12

2-4-7 Guarding ......................................................................................... 2-13

2-4-8 Grounded device measurement capability ................................ 2-14

––––––– RF impedance measurement –––––––

2-5 Theory of RF I-V measurement method ..................................... 2-16

2-6 Difference between RF I-V and network analysis

methods .......................................................................................... 2-18

2-7 Key measurement functions ........................................................ 2-20

2-7-1 OSC level ........................................................................................ 2-20

2-7-2 Test port ......................................................................................... 2-20

2-7-3 Calibration ..................................................................................... 2-21

2-7-4 Compensation ................................................................................ 2-21

2-7-5 Measurement range ...................................................................... 2-21

2-7-6 DC bias ............................................................................................ 2-21

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Agilent Technologies 4294A Specifications Page 3