Agilent Technologies 4294A Specifications Page 66

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When the test port is extended, calibration should be performed at the end of extension cable, as
discussed in section 3. Thereby, the calibration plane is moved to the end of cable.
To perform measurements met to specified accuracy, the instrument should be calibrated before
measurement is initiated and each time the frequency setting is changed. The calibration defines
the calibration reference plane at which measurement accuracy is optimized.
If a component could be measured directly at the calibration plane, it would be possible to obtain
measured values within the specified accuracy of the instrument. However, the real-world compo-
nents cannot be connected directly to the calibrated test port and, a suitable test fixture is used for
measurements. Calibration is not enough to measure the DUT accurately. Because measurement is
made for the DUT connected at the contact terminals of the test fixture (different from calibration
plane), the residual impedance, stray admittance and electrical length that exist between the cali-
bration plane and the DUT will produce additional measurement errors. As a result, compensation
is required to minimize those test fixture induced errors.
4-6-2. Error source model
Regarding ordinary non-coaxial test fixtures, consider an error source model similarly to that in low
frequency measurements. Figure 4-14 (a) illustrates typical test fixture configuration and a model
of error sources. The test fixture is configured with two electrically different sections: A coaxial
connector section and a non-coaxial terminal section for connecting DUT. The characteristic of the
coaxial section can be modeled using an equivalent transmission line (distributed constant circuit)
and represented by propagation constants. Normally, as the coaxial section is short enough to
neglect the propagation loss, we can assume that only the phase shift (error) expressed as electrical
length exists. The characteristic of the non-coaxial section can be described using the residual
impedance and stray admittance model in two-terminal measurement configuration as shown in
Figure 4-14 (b). We can assume residual impedance, Zs, in series with DUT and stray admittance,
Yo, in parallel with DUT.
Figure 4-14. Typical error source model
4-14
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