Agilent Technologies 4294A Specifications download pdf (Page 42)

Table 3-1. Test fixture’s DUT connection configuration and applications

3-3-2. User fabricated test fixtures

If the DUT is not applicable to Agilent supplied test fixtures, create an application specific test fix-

ture. Key points to consider when fabricating a test fixture are:

(1) Residuals must be minimized. To minimize the residuals, the 4TP configuration should be main-

tained as close as possible to the DUT. Also, proper guarding techniques will eliminate the

effects of stray capacitance. See “Eliminating the stray capacitance effect” given in this section

for practical use of guarding.

(2) Contact resistance must be minimized. Contact resistance will cause additional error. In the case of

the 2T configuration, it directly affects the measurement result. The contact electrodes should

hold the DUT firmly and should always be clean. Use a corrosion-free material for the elec-

trodes.

(3) Contacts must be able to be opened and shorted. Open/short compensation can easily reduce the

effects of the test fixture residuals. To perform an open/short measurement, you must open

and short the contact electrodes. For an open measurement, the contact electrodes should be

located the same distance apart as when the DUT is connected. For the short measurement, a

lossless (low impedance) conductor should be connected between the electrodes, or contact

electrodes should be connected directly. If the four-terminal configuration is kept to the elec-

trodes, make the connections of current and potential terminals and then make an open or

short as shown in Figure 3-6.

3-6

DUT Applicable Agilent Basic characteristics Suitable

connection device type test fixture application

configuration

2-terminal Leaded device 16047D • Measurement is Middle and high

16047E susceptible to the effect impedance DUTs and high

16065A of residual impedance frequency measurements.

42842A/B/C and contact resistance

Surface mounted 16034E • Usable frequency limit

device 16034G is high

16034H • Additional error at

16334A high frequencies is

Material 16451B smaller than in

16452A 4-terminal connection

In-circuit device 16095A

42941A

4-terminal Leaded device 16047A • Measurement is less Low and middle

16089A/B/C/D/E affected by residual impedance DUTs and low

Surface mounted 16044A impedance and contact frequency measurements.

device resistance (at relatively

low frequencies)

• Usable frequency limit

is low

• Additional error at

high frequencies is

greater than in

2-terminal connection

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