Agilent Technologies 4294A Specifications download pdf (Page 5)

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4-7-1 Variance in residual parameter value ........................................ 4-19

4-7-2 A difference in contact condition ............................................... 4-20

4-7-3 A difference in open and short compensation conditions ..... 4-21

4-7-4 Electromagnetic coupling with a conductor

near the DUT ................................................................................. 4-21

4-7-5 Variance in environmental temperature .................................... 4-22

SECTION 5 Impedance measurement applications and enhancements

Paragraph 5-1 Capacitor measurement ............................................................... 5-1

5-2 Inductor measurement ................................................................. 5-5

5-3 Transformer measurement .......................................................... 5-9

5-4 Diode measurement ...................................................................... 5-13

5-5 MOS FET measurement ............................................................... 5-14

5-6 Silicon wafer C-V measurement .................................................. 5-15

5-7 High frequency impedance measurement

using the probe .............................................................................. 5-18

5-8 Resonator measurement .............................................................. 5-20

5-9 Cable measurements .................................................................... 5-23

5-10 Balanced device measurement ................................................... 5-25

5-11 Battery measurement ................................................................... 5-27

5-12 Test signal voltage enhancement ................................................ 5-28

5-13 DC bias voltage enhancement ..................................................... 5-30

5-14 DC bias current enhancement .................................................... 5-32

5-15 Equivalent circuit analysis function and its application ........ 5-34

APPENDIX A The concept of a test fixture’s additional error .................................................. A-1

APPENDIX B Open and short compensation ...................................................................................... B-1

APPENDIX C Open, short and load compensation ............................................................................. C-1

APPENDIX D Electrical length compensation ..................................................................................... D-1

APPENDIX E Q measurement accuracy calculation .......................................................................... E-1

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Agilent Technologies 4294A Specifications Page 5