Agilent Technologies 54503A User's Guide download pdf (Page 136)

100

101

136 Chapter2

Making Measurements

Example 11: Time-Gated Measurement

The equation below can be used to calculate a correction value for the

measured noise. Subtract the correction from the measured value.

where:

is the impulse bandwidth which is 1.62 × resolution

bandwidth, for resolution bandwidths ≥300 Hz.

τ is the time interval over which the peak detection

occurs and is equal to the sweeptime/600.

Refer to Agilent Technologies Application Note 1303, page 18, for more

details.

Test Setup and Connection Diagram

Figure 2-68 shows a block diagram of the test setup. In Figure 2-68, the

signal source is treated as one block. The source produces a signal

RF-pulse train from one port and a TTL trigger signal from the other

port. The other blocks represent a spectrum analyzer with time-gating

capability and a multi-channel oscilloscope. As shown in the previous

section, the oscilloscope is very useful for illustrating the timing

interactions of the signals.

Instrument Connections

Spectrum analyzer RF input (the RF-pulse train from

the signal source)

Gate trigger input (the TTL timing

trigger signal from the signal source)

Gate output (the TTL voltage output

indicating whether the gate is on or

off)

Oscilloscope Gate trigger input (the TTL timing

trigger signal from the signal source;

this is same signal as the analyzer

gate trigger input.)

Gate output (This is the signal from

the spectrum analyzer BLKG/GATE

OUTPUT connector. The gate output

graphically shows the gate status

versus time.)

RF signal under test (the same

signal that is input to the spectrum

analyzer input)

Correction 10db log

2πγBW

e+()ln[]=

1 ... 135 136 137 ... 716

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