Agilent Technologies B2902 Service Manual download pdf (Page 86)

2- 46 Agilent B2900 SCPI Command Reference, Edition 2

Subsystem Command Summary

Reading Source/Measure Data

:CALC[c]:LIM[m]:COMP:DIG[:DATA]

pattern

:CALC[c]:LIM[m]:COMP:DIG[:DATA]?

Defines the bit pattern used to indicate a

failure of the compliance status check

specified by m.

pattern=0 to 16383

0

:CALC[c]:LIM[m]:COMP:FAIL criter

ia

:CALC[c]:LIM[m]:COMP:FAIL?

Sets the judgement criteria for the

compliance status check specified by m.

criteria=IN determines that the limit test

has failed if the channel goes into the

compliance state.

criteria=OUT determines that the limit

test has failed if the channel comes out of

the compliance state.

IN

:CALC[c]:LIM[m]:FAIL?

Returns the result of the limit test

specified by m. 0: Passed, 1: Failed.

:CALC[c]:LIM[m]:FUNC type

:CALC[c]:LIM[m]:FUNC?

Sets the type of the limit test specified by

m.

type=COMP sets the compliance status

check which checks if the channel is in

the compliance status.

type=LIM sets the limit test which checks

if the measurement value is between the

upper limit and the lower limit.

LIM

:CALC[c]:LIM[m]:LOW limit

:CALC[c]:LIM[m]:LOW? [MINimum|MA

Ximum|DEFault]

Sets a lower limit used for the limit test

specified by m.

limit=MINimum|MAXimum|DEFault|

-9.999999E+20 to +9.999999E+20

-1

:CALC[c]:LIM[m]:LOW:DIG[:DATA] p

attern

:CALC[c]:LIM[m]:LOW:DIG[:DATA]?

Defines the bit pattern used to indicate

failed-by-exceeding-lower-limit of the

limit test specified by m. The bit pattern is

used for the GRAD composite limit test.

pattern=0 to 16383

0

Command Summary Reset setting

1 ... 85 86 87 ... 326

Comments to this Manuals

No comments