Agilent Technologies 4294A Service Manual download pdf (Page 40)

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40 Chapter 3

Setting Measurement Conditions

Setting the On-screen Arrangement

You carry out most of the on-screen arrangement settings independently for trace A and

trace B. After made, these will take effect on the active trace. Thus you need to use the

command given below to properly switch the active trace settings from one trace to the

other.

• “TRAC” on page 457

Setting how the way traces are displayed

You can select one of two ways to display traces A and B: overlapping the traces in the

same area or horizontally splitting the screen into two halves to display the traces

separately. When the traces are overlapped, you can set an inactive trace so that it

disappears. To make these settings, use the commands given below.

• “SPLD” on page 443

• “HIDI” on page 318

If the measurement results are stored in a memory trace (carried out with the “DATMEM”

command on page 285), then set the trace to display by using the command given below.

• “DISP” on page 301

To turn on the function that allows you to accumulate a group of overlapping measurement

results without updating each trace’s display, use the command given below.

• “ACCUD” on page 263

NOTE The parameters set by use of the “SPLD” and “ACCUD” commands are common to traces

A and B.

If a phase is used as the measurement parameter, you can select the unit for the phase to

display. You can also specify whether or not to display extended phases (repeatedly

displaying phases outside the range of -180 ° to +180 °). To make these settings, use the

commands given below.

• “PHAU” on page 398

• “EXPP” on page 314

If a scalar value is used as the measurement parameter, you can set an offset for the data to

be displayed in a data trace by using the command given below.

• “DATOVAL” on page 286

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Agilent Technologies 4294A Service Manual Page 40

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